Journal of Shanghai University(Natural Science Edition) ›› 2016, Vol. 22 ›› Issue (6): 719-726.doi: 10.3969/j.issn.1007-2861.2015.04.006

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Preparation and properties of (TA)5T-structured TiO2/Ag assembly films

HAN Wei, WANG Yue, TANG Haotian, YU Jingjing, YU Shengwen   

  1. School of Materials Science and Engineering, Shanghai University, Shanghai 200444, China
  • Received:2015-02-06 Online:2016-12-30 Published:2016-12-30

Abstract:

(TA)5T-structured TiO2/Ag assembly films with different Ag contents were prepared by magnetron sputtering, and its phase constitution and properties were studied. The film structure of TiO2/Ag assembly films was analyzed with X-ray diffraction(XRD), and surface morphology was observed with scanning electron microscope (SEM). Absorption spectrums of the films were measured with ultraviolet-visible spectrophotometry(UV-VIS). Resistivities of the films were calculated from I-V curves measured with a Keithley 2400. The results showed that anatase phase of TiO2 was formed in all (TA)5Tstructured TiO2/Ag assembly films annealed at 500 ℃ for 60 min in an N2 furnace. The main crystalline size of TiO2 increased with the increasing Ag content. Irregular-shaped and different-sized Ag nanoparticles distributed unevenly on the film surface. Compared with pure TiO2 films, the absorption edges of (TA)5T-structured TiO2/Ag assembly films shifted toward blue and had surface plasmon resonance (SPR) absorption peaks. Resistivities of the films decreased with the increasing Ag content. In (TA)5T-structured TiO2/Ag assembly films, the position of surface plasmon resonance could be regulated roughly through changing the Ag content.

Key words: Ag content, magnetron sputtering, surface plasmon resonance (SPR), TiO2/Ag assembly film