上海大学学报(自然科学版) ›› 2014, Vol. 20 ›› Issue (6): 680-688.doi: 10.3969/j.issn.1007-2861.2014.04.007

• 特稿 • 上一篇    下一篇

Effect of AIBI as Free Radical Initiator on Abrasive-Free Polishing of Hard Disk Substrate

 REN Xiao-yan, LEI Hong, CHEN Ru-ling, CHEN Yi   

  1. Nano-Science and Technology Research Center, Shanghai University, Shanghai 200444, China
  • 出版日期:2014-12-23 发布日期:2014-12-23
  • 通讯作者: Lei Hong, Professor, Ph. D. E-mail:hong lei2005@aliyun.com
  • 作者简介:Lei Hong, Professor, Ph. D., E-mail: hong lei2005@aliyun.com
  • 基金资助:

    the National Natural Science Foundation of China (51175317), the Doctoral Program of Higher Education of China (20123108110016)

Effect of AIBI as Free Radical Initiator on Abrasive-Free Polishing of Hard Disk Substrate

 REN Xiao-yan, LEI Hong, CHEN Ru-ling, CHEN Yi   

  1. Nano-Science and Technology Research Center, Shanghai University, Shanghai 200444, China
  • Online:2014-12-23 Published:2014-12-23
  • Contact: Lei Hong, Professor, Ph. D., E-mail: hong lei2005@aliyun.com E-mail:hong lei2005@aliyun.com
  • About author:Lei Hong, Professor, Ph. D., E-mail: hong lei2005@aliyun.com

摘要: To optimize the existing slurry for abrasive-free polishing (AFP) of hard disk substrate, a water-soluble free radical initiator, 2, 20-azobis [2-(2-imidazolin-2-yl) propane] dihydrochloride (AIBI) is introduced to the H2O2-based slurry. The polishing results show that, the material removal rate (MRR) of hard disk substrate polished with H2O2-based slurry containing AIBI is obviously higher than that without AIBI. The acting mechanism of the improved MRR is investigated. Electron paramagnetic resonances tests show that, by comparison with H2O2 slurry, H2O2-AIBI slurry provides higher concentration of hydroxyl radicals. Auger electron spectrometer analyses further demonstrate that the oxidation ability of H2O2-AIBI slurry is much greater than H2O2 slurry. In addition, potentiodynamic
polarization tests show that the corrosion dissolution rate of hard disk substrate in H2O2-AIBI slurry is increased. Therefore that stronger oxidation ability and a higher corrosion dissolution rate of H2O2-AIBI slurry lead to higher MRR can be concluded.

关键词: abrasive-free polishing (AFP), hard disk substrate, initiator, material removal rate

Abstract: To optimize the existing slurry for abrasive-free polishing (AFP) of hard disk substrate, a water-soluble free radical initiator, 2, 20-azobis [2-(2-imidazolin-2-yl) propane] dihydrochloride (AIBI) is introduced to the H2O2-based slurry. The polishing results show that, the material removal rate (MRR) of hard disk substrate polished with H2O2-based slurry containing AIBI is obviously higher than that without AIBI. The acting mechanism of the improved MRR is investigated. Electron paramagnetic resonances tests show that, by comparison with H2O2 slurry, H2O2-AIBI slurry provides higher concentration of hydroxyl radicals. Auger electron spectrometer analyses further demonstrate that the oxidation ability of H2O2-AIBI slurry is much greater than H2O2 slurry. In addition, potentiodynamic polarization tests show that the corrosion dissolution rate of hard disk substrate in H2O2-AIBI slurry is increased. Therefore that stronger oxidation ability and a higher corrosion dissolution rate of H2O2-AIBI slurry lead to higher MRR can be concluded.

Key words: abrasive-free polishing (AFP), hard disk substrate, material removal rate;initiator

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