上海大学学报(自然科学版) ›› 2014, Vol. 20 ›› Issue (6): 701-706.doi: 10.3969/j.issn.1007-2861.2014.01.027

• 材料科学与工程 • 上一篇    下一篇

原位退火对CdZnTe 晶体性能的影响

 张涛, 闵嘉华, 梁小燕, 滕家琪, 时彬彬, 王林军   

  1. 上海大学材料科学与工程学院, 上海200072
  • 收稿日期:2013-11-07 出版日期:2014-12-23 发布日期:2014-12-23
  • 通讯作者: 闵嘉华(1961—), 男, 高级实验师, 博士生导师, 研究方向为半导体核辐射探测器材料. E-mail: minjh@mail.shu.edu.cn
  • 作者简介:闵嘉华(1961—), 男, 高级实验师, 博士生导师, 研究方向为半导体核辐射探测器材料. E-mail: minjh@mail.shu.edu.cn
  • 基金资助:

    国家自然科学基金资助项目(11275122); 上海市科委基金重点资助项目(11530500200); 上海市教委科研
    创新基金资助项目(12ZZ096)

Effect of In-situ Annealing on Properties of CdZnTe Crystals

ZHANG  Thao, MIN  Jia-Hua, LIANG  Xiao-Yan, TENG  Jia-Qi, SHI  Bin-Bin, WANG  Lin-Jun   

  1. School of Materials Science and Engineering, Shanghai University, Shanghai 200072, China
  • Received:2013-11-07 Online:2014-12-23 Published:2014-12-23

摘要: 采用改进的垂直布里奇曼生长法生长CdZnTe(CZT)单晶, 并在晶体生长后期采取长时间的原位恒温退火. 采用红外透射显微镜、I-V 特性曲线以及多道能谱仪测试经过原位退火后的晶体内部Te 夹杂相分布、电阻率大小以及能谱响应. 结果表明, 原位退火可以大幅降低CZT 晶体内部大尺寸Te 夹杂相的密度, 晶体内绝大部分的Te 夹杂都集中在5 μm 以内. 此外, 原位退火后的晶体电阻率从4.54×108 Ω·cm上升至3.73×1010 Ω·cm. 原位退火后的CZT晶体对 241Am@59.5 keV  射线表现出了良好的能量分辨率, 为7.29%.

关键词: CdZnTe, Te 夹杂相, 布里奇曼法, 探测器, 退火

Abstract: CdZnTe (CZT) single crystals were grown by a modified vertical Bridgman method. After the growth was completed, the crystals were annealed at a constant temperature for a long time. Infrared microscope, I-V characteristic curves, and multi-channel spectrometer were employed to analyze Te inclusions distribution in the crystal, electrical resistivity and spectroscopy response of CZT wafers. The results show that in-situ annealing can greatly decrease concentration of Te inclusions, and most of the Te inclusion sizes are less than 5 μm. In addition, electrical resistivity of CZT is increased from 4.54×108 to 3.73×1010  after annealing. The 241Am@59.5 keV   keV keV-ray pulse height spectra of CZT crystal after in-situ annealing reaches 7.29%.

Key words: anneal, Bridgman method, CdZnTe (CZT), detector, Te inclusions

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