[1] Shin H Y, Sun C Y. Temperature-gradient-solution grown CdTe crystals for gamma-ray detectors [J].Journal of Crystal Growth, 1998, 186: 67-78.[2] Limousin O. New trends in CdTe and CdZnTe detectors for X- and gamma-ray applications [J].Nucl Instrument Methods Phys Res A, 2003, 504: 24-37.[3] Hermon H, Schieber M, Lee E Y, et al. CZT detectors fabricated from horizontal and verticalBridgman-grown crystals [J]. Nucl Instrum Methods Phys Res A, 2001, 458: 503-510.[4] Benson J D, Cornfeld A B, Martinka M, et al. Ellipsometric analysis of CdZnTe preparationfor HgCdTe MBE growth [J]. Journal of Crystal Growth, 1997, 175/176: 659-664.[5] Schlesinger T E, Toney J E, Yoon H, et al. Cadmium zinc telluride and its use as a nuclearradiation detector material [J]. Materials Science & Engineering, 2001, 32: 103-189.[6] 朱世富, 赵北君, 王瑞林, 等. 室温半导体核辐射探测器新材料及其器件研究[J]. 人工晶体学报,2004, 33(1): 6-12.[7] 王东, 闵嘉华, 梁小燕, 等. 溶液法制备CdZnTe 晶体中Te 夹杂相分析[J]. 上海大学学报: 自然科学版, 2013, 19(1): 67-70.[8] Bolotnikov A E, Camarda G S, Carini G, et al. Performance-limiting defects in CdZnTedetectors [J]. IEEE Transactions on Nuclear Science, 2006, 54(4): 821-827.[9] Zeng D M, Jie W Q, Zha G Q, et al. Effect of annealing on the residual stress and straindistribution in CdZnTe wafers [J]. Journal of Crystal Growth, 2007, 305: 50-54.[10] Yu P F, He Y H, Wang T, et al. Characterization of detector-grade CdZnTe: Al crystalsobtained by annealing [J]. Journal of Crystal Growth , 2011, 324: 22-25.[11] Vydyanath H R, Ellsworth J A, Fisher R F. Vapor phase equilibria in the CZT alloysystem [J]. Journal of Electron Mater, 1993, 22(8): 1067-1073.[12] Yadava R D S, Sundersheshu B S, Anandan M, et al. Precipitation in CdTe crystals studiedthrough Mie scattering [J]. Journal of Electronic Materials, 1994, 23(12): 1349-1357. |