Journal of Shanghai University(Natural Science Edition) ›› 2022, Vol. 28 ›› Issue (3): 545-551.doi: 10.12066/j.issn.1007-2861.2385

• Microstructure Image Recognition and Microstructure Analysis • Previous Articles     Next Articles

High-throughput X-ray characterization of discrete component samples of rare-earth-doped thermal barrier-coating materials

WU Guang1, SONG Xuemei2, ZHANG Yifeng1, ZENG Yi2, FENG Zhenjie   

  1. 1. Materials Genome Institute, Shanghai University, Shanghai 200444, China
    2. Analysis and Testing Center for Inorganic Materials, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China
  • Received:2022-03-28 Online:2022-06-30 Published:2022-05-27

Abstract:

With continuous research and development in materials science, the high-throughput X-ray characterization technique is widely used in material research and development to significantly improve the efficiency of new materials. In addition, it is a vital technique for material genome engineering research. A high-throughput X-ray characterization system was designed, and the effect of different contents of rare-earth element-doped thermal barrier-coating materials on their structural phase stability was investigated. The X-ray source could perform high-precision $x$-$y$ two-dimensional plane translation. Under the condition of ensuring data sample quality, multiple discrete samples could be detected within a short time.

Key words: high-throughput X-ray characterization, thermal barrier coating, rare earth elements

CLC Number: