Journal of Shanghai University(Natural Science Edition) ›› 2022, Vol. 28 ›› Issue (3): 552-557.doi: 10.12066/j.issn.1007-2861.2384

• Microstructure Image Recognition and Microstructure Analysis • Previous Articles     Next Articles

High-throughput X-ray diffraction of La$_{{1-x}}$Sr$_{x}$TiOx$_{3}$ thin films

ZHANG Yifeng, WANG Yangzhou, WU Guang, CHEN Fei, FENG Zhenjie()   

  1. Materials Genome Institute, Shanghai University, Shanghai 200444, China
  • Received:2022-03-28 Online:2022-06-30 Published:2022-05-27
  • Contact: FENG Zhenjie E-mail:fengzhenjie@shu.edu.cn

Abstract:

Different from the traditional low-efficiency "trial-and-error" material development method, the high-throughput material synthesis and material characterization methods significantly accelerate the development and reformation of materials science. In this study, X-ray diffraction patterns of La$_{1-x}$Sr$_{x}$TiO$_{3}$ thin films were obtained through high-throughput X-ray diffraction experiments. The continuous change in the La$_{1-x}$Sr$_{x}$TiO$_{3}$ thin film was analyzed. This study will guide future experimental studies on various types of high-throughput X-ray diffraction.

Key words: high-throughput X-ray diffraction, SrTiO$_{3}$, La$_{1-x}$Sr$_{x}$TiO$_{3}$ thin film

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