中文

Journal of Shanghai University（Natural Science Edition） ›› 2009, Vol. 15 ›› Issue (4): 336-341.

• Communication and Information • Previous Articles     Next Articles

Wrapper Scan Chain Balance and Test Scheduling Co-optimization for Core-Based System-on-chip Test

  

  1. Key Laboratory of Specialty Fiber Optics and Optical Access Networks, Shanghai University, Shanghai 200072, China
  • Received:2008-10-19 Online:2009-08-30 Published:2009-08-30

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Abstract:

A new wrapper scan chain balance algorithm called exchange optimization and a new test scheduling method called local optimization are presented in this paper. These two algorithms collaborate on the IP level and top level according to idle bit percentage on test bus (IBPTB) so as to greatly reduce system-on-chip (SOC) test time. To demonstrate the practicality and validity of both algorithms and their cooperation performance, ITC’02 SOC benchmark circuits are used as the experiment objects. The result on core6 in p93791 shows that exchange optimization can achieve more balanced wrapper scan chains than the classic algorithm of best fit decreasing (BFD) by up to 2.6%. The result on d695 shows that the total test time achieved by local optimization according to IBPTB can be up to 12.7% lower than that by the classic integer linear programming (ILP) algorithm.

Key words: wrapper scan chain balance; test scheduling; cooptimization