In order to obtain the lifespan information of vacuum fluorescent display (VFD) within a short time to reduce the cost of lifespan prediction, four constant stress accelerated life tests (CSALT) were conducted, and the VFD failure mechanism analyzed. Lifespan prediction was done by modeling the lifespan with the three-parameter Weibull distribution. A bilinear regression method was used to estimate the Weibull parameters. Numerical results show that the test scheme of CSALT is appropriate, lifespan of VFD follows a threeparameter Weibull distribution, the life-stress relationship satisfies the linear Arrhenius equation, and the VFD failure mechanism is the same under different accelerationstress levels. The proposed test method and the theoretical model allow rapid lifespan prediction of VFD.