Microstructure Image Recognition and Microstructure Analysis

High-throughput X-ray diffraction of La$_{{1-x}}$Sr$_{x}$TiOx$_{3}$ thin films

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  • Materials Genome Institute, Shanghai University, Shanghai 200444, China

Received date: 2022-03-28

  Online published: 2022-05-27

Abstract

Different from the traditional low-efficiency "trial-and-error" material development method, the high-throughput material synthesis and material characterization methods significantly accelerate the development and reformation of materials science. In this study, X-ray diffraction patterns of La$_{1-x}$Sr$_{x}$TiO$_{3}$ thin films were obtained through high-throughput X-ray diffraction experiments. The continuous change in the La$_{1-x}$Sr$_{x}$TiO$_{3}$ thin film was analyzed. This study will guide future experimental studies on various types of high-throughput X-ray diffraction.

Cite this article

ZHANG Yifeng, WANG Yangzhou, WU Guang, CHEN Fei, FENG Zhenjie . High-throughput X-ray diffraction of La$_{{1-x}}$Sr$_{x}$TiOx$_{3}$ thin films[J]. Journal of Shanghai University, 2022 , 28(3) : 552 -557 . DOI: 10.12066/j.issn.1007-2861.2384

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