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Journal of Shanghai University >

2022 , Vol. 28 >Issue 3: 545 - 551

DOI: https://doi.org/10.12066/j.issn.1007-2861.2385

Microstructure Image Recognition and Microstructure Analysis

High-throughput X-ray characterization of discrete component samples of rare-earth-doped thermal barrier-coating materials

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  • 1. Materials Genome Institute, Shanghai University, Shanghai 200444, China
    2. Analysis and Testing Center for Inorganic Materials, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050, China

Received date: 2022-03-28

  Online published: 2022-05-27

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Abstract

With continuous research and development in materials science, the high-throughput X-ray characterization technique is widely used in material research and development to significantly improve the efficiency of new materials. In addition, it is a vital technique for material genome engineering research. A high-throughput X-ray characterization system was designed, and the effect of different contents of rare-earth element-doped thermal barrier-coating materials on their structural phase stability was investigated. The X-ray source could perform high-precision $x$-$y$ two-dimensional plane translation. Under the condition of ensuring data sample quality, multiple discrete samples could be detected within a short time.

Key words： high-throughput X-ray characterization; thermal barrier coating; rare earth elements

Cite this article

WU Guang, SONG Xuemei, ZHANG Yifeng, ZENG Yi, FENG Zhenjie . High-throughput X-ray characterization of discrete component samples of rare-earth-doped thermal barrier-coating materials[J]. Journal of Shanghai University, 2022 , 28(3) : 545 -551 . DOI: 10.12066/j.issn.1007-2861.2385

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