收稿日期: 2022-03-28
网络出版日期: 2022-05-27
基金资助
国家重点研发计划资助项目(2018YFB0704400)
High-throughput X-ray diffraction of La$_{{1-x}}$Sr$_{x}$TiOx$_{3}$ thin films
Received date: 2022-03-28
Online published: 2022-05-27
高通量材料合成方法和高通量材料表征手段区别于传统低效率的 "试错法"材料发展方法, 极大地加速了材料科学的变革和发展. 通过设计程序进行了高通量 X 射线衍射实验, 在保证数据分辨率条件下, 高效地表征了 La$_{1-x}$Sr$_{x}$TiO$_{3}$ 薄膜上多个数据位点的晶体结构, 验证了其成分的连续变化性质, 为后续开展更多类型的高通量 X 射线衍射实验提供了指导.
张一烽, 王洋洲, 吴广, 陈飞, 冯振杰 . La$_{{1-x}}$Sr$_{x}$TiO$_{3}$ 薄膜的高通量 X 射线衍射[J]. 上海大学学报(自然科学版), 2022 , 28(3) : 552 -557 . DOI: 10.12066/j.issn.1007-2861.2384
Different from the traditional low-efficiency "trial-and-error" material development method, the high-throughput material synthesis and material characterization methods significantly accelerate the development and reformation of materials science. In this study, X-ray diffraction patterns of La$_{1-x}$Sr$_{x}$TiO$_{3}$ thin films were obtained through high-throughput X-ray diffraction experiments. The continuous change in the La$_{1-x}$Sr$_{x}$TiO$_{3}$ thin film was analyzed. This study will guide future experimental studies on various types of high-throughput X-ray diffraction.
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