应用科学学报 ›› 1985, Vol. 3 ›› Issue (2): 186-188.

• 论文 • 上一篇    

实地测量8~14μm比辐射率的方法

吕斯骅   

  1. 北京大学
  • 收稿日期:1982-06-20 修回日期:1984-04-08 出版日期:1985-06-30 发布日期:1985-06-30

IN SITU THE MEASUREMENT METHOD OF EMISSIVITY FOR 8-14μm

LU SIHUA   

  1. Beijing University
  • Received:1982-06-20 Revised:1984-04-08 Online:1985-06-30 Published:1985-06-30

摘要: 机载多光谱扫描仪中常有8~14μm的红外通道,用于测量各种物体的热辐射强度.物体的热辐射强度除与物体的实际温度T有关外还与物体的比辐射率ε有关.物体的组成、表面状态、含水量等各种因素均能影响ε的大小[1],故实地测量各种地物的ε对解译热红外遥感图象是有意义的.

Abstract: The method described in this paper provides an improvement on,T. K. Buettner's method. It is simpler and more rigorous than that of Buettners. The instrumental error and personal error are discussed in detail. No significant differences have been found between our results and the generally accepted data.