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应用科学学报 ›› 2002, Vol. 20 ›› Issue (3): 301-304.

• 论文 • 上一篇    下一篇

低功耗内建自测试的参数优选

胡晨, 杨军, 史又华   

  1. 东南大学国家专用集成电路系统工程技术研究中心, 江苏南京 210096
  • 收稿日期:2001-07-19 修回日期:2001-10-20 出版日期:2002-09-30 发布日期:2002-09-30
  • 作者简介:胡晨(1967-),男,江苏武进人,副教授,博士.

Parameter Optimization of Low Power BIST

HU Chen, YANG Jun, SHI You-hua   

  1. National ASIC System Engineering Center, Southeast University, Nanjing 210096, China
  • Received:2001-07-19 Revised:2001-10-20 Online:2002-09-30 Published:2002-09-30

PDF

79

被引次数

6

摘要： 提出了面向低峰值功耗进行BIST参数优化的问题,给出了相应的种子选取算法.实验结果表明该方法不需要额外的硬件开销,并在保证故障覆盖率的前提下峰值功耗有明显降低.

关键词: 低功耗, 内建自测试, 线性反馈移位寄存器

Abstract: With the fast growing portable-electronics market and stricter requirement of the wafer test, the power consumption problem of built-in self-test (BIST) has attracted more and more attention. In this paper, a parameter optimization algorithm that can lower the peak power during test application has been proposed. Experiment results show that peak power is reduced considerably with no extra silicon overhead of test logic on the condition that fault coverage is guaranteed.

Key words: low power, linear feedback shift register, built-in self-test

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